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Commit 62a44820 authored by dwf1m12's avatar dwf1m12
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remove ASIC_TEST_PORTS dependence at chip level

parent 841f26fb
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...@@ -19,7 +19,7 @@ module nanosoc_chip #( ...@@ -19,7 +19,7 @@ module nanosoc_chip #(
inout wire VSS, inout wire VSS,
inout wire VDDACC, inout wire VDDACC,
`endif `endif
`ifdef ASIC_TEST_PORTS //`ifdef ASIC_TEST_PORTS
input wire diag_mode, input wire diag_mode,
input wire diag_ctrl, input wire diag_ctrl,
input wire scan_mode, input wire scan_mode,
...@@ -34,7 +34,7 @@ module nanosoc_chip #( ...@@ -34,7 +34,7 @@ module nanosoc_chip #(
input wire uart_rxd_i, // UART RXD input wire uart_rxd_i, // UART RXD
output wire uart_txd_o, // UART TXD output wire uart_txd_o, // UART TXD
input wire swd_mode, // SWD mode input wire swd_mode, // SWD mode
`endif //`endif
input wire clk_i, input wire clk_i,
// output wire xtal_clk_o, // output wire xtal_clk_o,
input wire test_i, input wire test_i,
...@@ -111,18 +111,18 @@ module nanosoc_chip #( ...@@ -111,18 +111,18 @@ module nanosoc_chip #(
assign PLL_CLK = clk_i; // Default to no PLL assign PLL_CLK = clk_i; // Default to no PLL
`ifdef ASIC_TEST_PORTS //`ifdef ASIC_TEST_PORTS
assign SYS_SCANENABLE = scan_enable; assign SYS_SCANENABLE = scan_enable;
assign SYS_TESTMODE = scan_mode; assign SYS_TESTMODE = scan_mode;
assign SYS_SCANINHCLK = 1'b1; assign SYS_SCANINHCLK = 1'b1;
/// assign scan_out = scan_in; /// assign scan_out = scan_in;
assign bist_out = bist_in; assign bist_out = bist_in;
/// assign uart_txd_o = uart_rxd_i; /// assign uart_txd_o = uart_rxd_i;
`else //`else
assign SYS_SCANENABLE = test_i & swdio_i; // assign SYS_SCANENABLE = test_i & swdio_i;
assign SYS_TESTMODE = test_i; // assign SYS_TESTMODE = test_i;
assign SYS_SCANINHCLK = 1'b1; // assign SYS_SCANINHCLK = 1'b1;
`endif //`endif
//-------------------------- //--------------------------
// Clock Wiring // Clock Wiring
...@@ -171,7 +171,7 @@ module nanosoc_chip #( ...@@ -171,7 +171,7 @@ module nanosoc_chip #(
assign p1_e[3] = 1'b1; assign p1_e[3] = 1'b1;
assign p1_z[3] = 1'b0; assign p1_z[3] = 1'b0;
assign P1_IN_MUX[4] = (alt_mode) ? uart_txd_i : p1_i[4]; // RXD2 assign P1_IN_MUX[4] = (alt_mode) ? uart_rxd_i : p1_i[4]; // RXD2
assign uart_txd_o = P1_OUT_MUX[5]; // TXD2 assign uart_txd_o = P1_OUT_MUX[5]; // TXD2
assign P1_IN_MUX[15:5] = p1_i[15:5]; // IO MUX controlled bidirectionals assign P1_IN_MUX[15:5] = p1_i[15:5]; // IO MUX controlled bidirectionals
......
...@@ -182,7 +182,7 @@ nanosoc_chip_cfg #( ...@@ -182,7 +182,7 @@ nanosoc_chip_cfg #(
.VSS (VSS), .VSS (VSS),
.VDDACC (VDDACC), .VDDACC (VDDACC),
`endif `endif
`ifdef ASIC_TEST_PORTS //`ifdef ASIC_TEST_PORTS
.diag_mode (soc_diag_mode ), .diag_mode (soc_diag_mode ),
.diag_ctrl (soc_diag_ctrl ), .diag_ctrl (soc_diag_ctrl ),
.scan_mode (soc_scan_mode ), .scan_mode (soc_scan_mode ),
...@@ -193,11 +193,11 @@ nanosoc_chip_cfg #( ...@@ -193,11 +193,11 @@ nanosoc_chip_cfg #(
.bist_enable (soc_bist_enable ), .bist_enable (soc_bist_enable ),
.bist_in (soc_bist_in ), // soc bist control inputs .bist_in (soc_bist_in ), // soc bist control inputs
.bist_out (soc_bist_out ), // soc test status outputs .bist_out (soc_bist_out ), // soc test status outputs
.alt_mode (soc_alt_mode )// ALT MODE = UART .alt_mode (soc_alt_mode ),// ALT MODE = UART
.uart_rxd_i (soc_uart_rxd_i ) // UART RXD .uart_rxd_i (soc_uart_rxd_i ), // UART RXD
.uart_txd_o (soc_uart_txd_o ) // UART TXD .uart_txd_o (soc_uart_txd_o ), // UART TXD
.swd_mode (soc_swd_mode ), // SWD mode .swd_mode (soc_swd_mode ), // SWD mode
`endif //`endif
.clk_i (pad_clk_i), .clk_i (pad_clk_i),
.test_i (soc_scan_mode), //(test_i), .test_i (soc_scan_mode), //(test_i),
.nrst_i (soc_nreset), //(nrst_i), .nrst_i (soc_nreset), //(nrst_i),
......
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